- 詳細
- カテゴリ: トップページ
- 公開日:2013年12月26日
- 参照数: 20737
2017/08/01
IRDiO is an OLCR-type optical reflectometer.
IRDiO is highly effective for optical characteristic inspection of silicon photonics (SiPh) devices and chip-level evaluation during development. Its extremely low second peak (noise peak) and clear measurement waveforms make it easy to distinguish the real peak, ensuring accurate evaluation results. This characteristic enables stable data acquisition even for SiPh products with complex optical circuits.
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